DA400S磁粉探傷儀

美國派克便攜式：
    美國PARKER公司磁粉探傷儀DA-400采用了許多*進技術來形成感應磁場，具有*通用性，固定的AC或DC磁場，用于表面和近表面缺陷的檢測，是控制器與固態電子器件為一體的高性能的輕便儀?？绅岣吣艽艌黾惺┘拥綑z測區，快速準確發現材料缺陷。磁極可將AC或DC磁場施加到各種形狀工件的檢測區域，沒有電弧燒傷。

的技術參數：

DA-400 Series Contour Probes^®

The DA-400 Contour Probe is a portable, self-contained instrument designed to produce a magnetic field on or within ferro-magnetic materials.

The selective AC and pulsed DC functions are built into a single reliable instrument. The AC mode produces an intense AC field for detection of surface defects and demagnetizing after inspection. The DC mode produces an intense pulsed DC field for detection of some subsurface defects.

Controls and solid-state electronics are contained within the high impact molded housing. Articulating legs allow the AC or DC field to be applied to the precise area of inspection on nearly any part of the surface shape... in the lab, factory or field site.

All Parker Contour Probes comply with the requirements of applicable specifications. Certified for European CE requirements.

• Versatility and powerful performance in a lightweight （8 lbs.） instrument
• Constant AC or pulsed DC fields with the flip of a switch for the location of surface and some sub-surface defects
• Apply continuous or residual magnetic fields and demagnetize too
• Use with dry powder, wet fluorescent or visible
• High impact molded housing
• One year repair/replacement guarantee

DA-400s Series Contour Probes^® SPECIFICATIONS