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使用徠卡 EM RES102，使您的樣品具備zui高水平的靈活性，具有輕薄、清潔、拋光、切割的坡度和結構。*的離子束研磨系統結合了在一個單工作臺面單元上制備TEM、SEM和LM樣品的特點。
各種樣品架可以進行多元化應用。除了高能量的離子銑工藝，徠卡EM RES102也可適于采用低離子能量處理非常柔軟的樣本。
Effective and Cost efficientOne system for TEM, SEM and LM applications SEM preparation of samples up to 25 mm diameter Improved effectiveness in TEM sample preparation with the production of large electron transparent areas for TEM analysis LAN capability for remote control and monitoring | SafeFully program controlled motorized ion source and sample movements for reproducible results |
Native specimensLN2 sample stage cooling to maintain the integrity of temperature sensitive samples | Easy operationIntegrated applications library Integrated helpfiles and tutorial videos for beginners and maintenance
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